JPH0125311Y2 - - Google Patents

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Publication number
JPH0125311Y2
JPH0125311Y2 JP1981156372U JP15637281U JPH0125311Y2 JP H0125311 Y2 JPH0125311 Y2 JP H0125311Y2 JP 1981156372 U JP1981156372 U JP 1981156372U JP 15637281 U JP15637281 U JP 15637281U JP H0125311 Y2 JPH0125311 Y2 JP H0125311Y2
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Japan
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Expired
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JP1981156372U
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English (en)
Japanese (ja)
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JPS5862252U (ja
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Priority to JP15637281U priority Critical patent/JPS5862252U/ja
Publication of JPS5862252U publication Critical patent/JPS5862252U/ja
Application granted granted Critical
Publication of JPH0125311Y2 publication Critical patent/JPH0125311Y2/ja
Granted legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP15637281U 1981-10-22 1981-10-22 表面検査装置 Granted JPS5862252U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15637281U JPS5862252U (ja) 1981-10-22 1981-10-22 表面検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15637281U JPS5862252U (ja) 1981-10-22 1981-10-22 表面検査装置

Publications (2)

Publication Number Publication Date
JPS5862252U JPS5862252U (ja) 1983-04-26
JPH0125311Y2 true JPH0125311Y2 (en]) 1989-07-28

Family

ID=29948915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15637281U Granted JPS5862252U (ja) 1981-10-22 1981-10-22 表面検査装置

Country Status (1)

Country Link
JP (1) JPS5862252U (en])

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5434290A (en) * 1977-08-22 1979-03-13 Omron Tateisi Electronics Co Defect inspecting apparatus
JPS5535276A (en) * 1978-09-04 1980-03-12 Nippon Steel Corp Edge pin-hole detector
CA1127259A (en) * 1978-10-19 1982-07-06 Jean Burtin Method and device for inspecting a moving sheet material for streaklike defects

Also Published As

Publication number Publication date
JPS5862252U (ja) 1983-04-26

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